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RESEARCH PAPERS: Radiative Transfer

Far-Infrared Transmittance and Reflectance of YBa2Cu3O7-δ Films on Si Substrates

[+] Author and Article Information
A. R. Kumar, Z. M. Zhang

Department of Mechanical Engineering, University of Florida, Gainesville, FL 32611

V. A. Boychev, D. B. Tanner

Department of Physics, University of Florida, Gainesville, FL 32611

L. R. Vale, D. A. Rudman

Electromagnetic Technology Division, National Institute of Standards and Technology, Boulder, CO 80303

J. Heat Transfer 121(4), 844-851 (Nov 01, 1999) (8 pages) doi:10.1115/1.2826074 History: Received September 08, 1998; Revised May 05, 1999; Online December 05, 2007

Abstract

The transmittance and reflectance of superconductive YBa2 Cu3 07-δ (YBCO) thin films deposited on Si substrates have been measured in the far-infrared frequency region from 10 to 100 cm−1 (wavelength from 1000 to 100 μm) at temperatures between 10 and 300 K. The effects of interference, optical resonance, and antireflection on the radiative properties of high-temperature superconducting (HTSC) films are observed and quantitatively analyzed. Furthermore, we have measured the reflectance of the HTSC film-substrate composites for radiation incident on the substrate side (backside reflectance) for the first time. The backside reflectance increases significantly from the normal state to the superconducting state at certain frequencies; this experimentally demonstrates that HTSC films can be used to build far-infrared intensity modulators. The complex refractive index of the YBCO films is determined from the measured transmittance using the Drude model in the normal state and a two-fluid model in the superconducting state. The complex refractive index obtained from this study is useful for various applications of YBCO films, including radiation modulators, detectors, and Fabry-Perot resonators.

Copyright © 1999 by The American Society of Mechanical Engineers
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