0
TECHNICAL PAPERS: Heat Transfer in Manufacturing

Fabry-Perot Resonators Built With YBa2Cu3O7−δ Films on Si Substrates

[+] Author and Article Information
A. R. Kumar

Department of Mechanical Engineering, University of Florida, Gainesville, FL 32611

V. A. Boychev, D. B. Tanner

Department of Physics, University of Florida, Gainesville, FL 32611

Z. M. Zhang

Department of Mechanical Engineering, University of Florida, Gainseville, FL 32611e-mail: zzhang@cimar.me.ufl.edu

J. Heat Transfer 122(4), 785-791 (May 25, 2000) (7 pages) doi:10.1115/1.1316784 History: Received July 09, 1999; Revised May 25, 2000
Copyright © 2000 by ASME
Your Session has timed out. Please sign back in to continue.

References

Brodbeck,  R., Pepe,  F. A., Tognina,  C., Bhend,  D., Zimmerman,  E., and Kneubuhl,  F. K., 1998, “Balloon-Borne Far-Infrared Fabry-Perot Spectrometers for Astrophysical Observations,” Infrared Physics and Technology, 39, pp. 393–414.
Vaughan, J. M., 1989, The Fabry-Perot Interferometer, Adam Hilger Publishers, Philadelphia, PA.
Komm,  D. S., Blanken,  R. A., and Brossier,  P., 1975, “Fast-Scanning Far-Infrared Fabry-Perot Interferometer,” Appl. Opt., 14, pp. 460–464.
Renk,  K. F., and Genzel,  L., 1962, “Interference Filters and Fabry-Perot Interferometers for the Far Infrared,” Appl. Opt., 1, pp. 643–648.
Belland,  P., and Lecullier,  J. C., 1980, “Scanning Fabry-Perot Interferometer: Performance and Optimum Use in the Far Infrared Range,” Appl. Opt., 19, pp. 1946–1952.
Renk,  K. F., Betz,  J., Schützmann,  J., Prückl,  A., Brunner,  B., and Lengfellner,  H., 1990, “Use of High Tc Superconductors for Far-Infrared Fabry-Perot Resonators,” Appl. Phys. Lett., 57, pp. 2148–2149.
Wiese,  P., Riederer,  X., Schützmann,  J., Gorshunov,  B., Betz,  J., and Renk,  K. F., 1992, “Far-Infrared Fabry Perot Filter of High Transmission With High-Tc Superconductor Reflectors,” Int. J. Infrared Millim. Waves, 13, pp. 65–70.
Pechen,  E. V., Vent,  S., Brunner,  B., Prückl,  A., Lipp,  S., Linder,  G., Alexandrov,  O., Schützmann,  J., and Renk,  K. F., 1992, “Far-Infrared Fabry-Perot Resonator With High TcYBa2Cu3O7−δ Films on Silicon Plates,” Appl. Phys. Lett., 61, pp. 1980–1982.
Malone,  C. G., Zhang,  Z. M., Flik,  M. I., and Cravalho,  E. G., 1993, “Optimized Design of Far-Infrared Fabry-Perot Resonators Fabricated From YBa2Cu3O7,” IEEE Trans. Appl. Supercond., 3, pp. 2852–2855.
Kumar, A. R., and Zhang, Z. M., 1999, “Far-Infrared Spectroscopy of High-Temperature Superconducting Films on Silicon Substrates,” Recent Research Developments in Applied Spectroscopy, Vol. 2, S. G. Pandalai, ed., Research Signpost, India, pp. 99–112.
Rice,  J. P., Grossman,  E. N., and Rudman,  D. A., 1994, “Antenna-Coupled High-Tc Air-Bridge Microbolometer on Silicon,” Appl. Phys. Lett., 65, pp. 773–775.
Kumar,  A. R., Zhang,  Z. M., Boychev,  V. B., Tanner,  D. B., Vale,  L. R., and Rudman,  D. A., 1999, “Far-Infrared Transmittance and Reflectance of YBa2Cu3O7−δ Films on Si Substrates,” ASME J. Heat Transfer, 121, pp. 844–851.
Sanderson,  R. B., and Scott,  H. E., 1971, “High Resolution Far Infrared Interferometer,” Appl. Opt., 10, pp. 1097–1102.
Kumar,  A. R., Zhang,  Z. M., Boychev,  V. B., and Tanner,  D. B., 1999, “Temperature-Dependent Far-Infrared Absorptance of Thin YBa2Cu3O7−δ Films in the Normal State,” Microscale Thermophys. Eng., 3, pp. 5–15.
Tanner, D. B., and Timusk, T., 1992, “Optical Properties of High-Temperature Superconductors,” Physical Properties of High-Temperature Superconductors, Vol. 3, D. M. Ginsberg, ed., World Scientific Publishing, Singapore, pp. 363–469.
Zhang,  Z. M., Kumar,  A. R., Boychev,  V. B., Tanner,  D. B., Vale,  L. R., and Rudman,  D. A., 1998, “Back-Side Reflectance of High Tc Superconducting Thin Films in the Far Infrared,” Appl. Phys. Lett., 73, pp. 1907–1909.
Loewenstein,  E. V., Smith,  D. R., and Morgan,  R. L., 1973, “Optical Constants of Far-Infrared Materials, 2: Crystalline Solids,” Appl. Opt., 12, pp. 398–406.
Kumar, A. R., 1999, “Far-Infrared Radiative Properties of Superconducting YBCO Films Deposited on Silicon Substrates,” Ph.D. Dissertation, University of Florida, Gainesville, FL.
Chen,  G., and Tien,  C. L., 1992, “Partial Coherence Theory of Thin Film Radiative Properties,” ASME J. Heat Transfer, 114, pp. 636–643.
Zhang, Z. M., 1994, “Optical Properties of Layered Structures for Partially Coherent Radiation,” Proc. Tenth Intl. Heat Transfer Conf., Vol. 2, G. F. Hewitt, ed., Taylor and Francis, London, pp. 177–182.
Grossman,  E. N., and McDonald,  D. G., 1995, “Partially Coherent Transmittance of Dielectric Lamellae,” Opt. Eng., 34, pp. 1289–1295.
Anderson,  C. F., and Bayazitoglu,  Y., 1996, “Radiative Properties of Films Using Partial Coherence Theory,” J. Thermophys. Heat Transfer, 10, pp. 26–32.

Figures

Grahic Jump Location
 The cross-sectional view of the resonator structure (not to scale)
Grahic Jump Location
 Schematic of the sample holder
Grahic Jump Location
 Measured transmittance of the Fabry-Perot resonator with the polyimide spacer at various temperatures
Grahic Jump Location
 Comparison between the measured and calculated transmittance, where d indicates the cavity length used in the calculation
Grahic Jump Location
 Measured and calculated transmittance of the resonator with the copper spacer at 300 and 10 K
Grahic Jump Location
 The effect of partial coherence on the resonant transmittance
Grahic Jump Location
 Calculated transmittance T, reflectance R, and phase shift upon reflection ϕ for the first reflector, together with Tres
Grahic Jump Location
 The effect of cavity length on the peak transmittance for the first and second-order resonance

Tables

Errata

Discussions

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In