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TECHNICAL PAPERS: Microscale Heat Transfer

Photo-Acoustic Measurement of Thermal Conductivity of Thin Films and Bulk Materials

[+] Author and Article Information
Xinwei Wang, Hanping Hu, Xianfan Xu

School of Mechanical Engineering, Purdue University, West Lafayette, IN 47907

J. Heat Transfer 123(1), 138-144 (Jun 25, 2000) (7 pages) doi:10.1115/1.1337652 History: Received October 25, 1999; Revised June 25, 2000
Copyright © 2001 by ASME
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References

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Figures

Grahic Jump Location
Schematic diagram of the apparatus for measuring diffuse reflectivity
Grahic Jump Location
Normalized amplitude as a function of the modulation frequency of Sample #1787
Grahic Jump Location
Normalized amplitude as a function of the modulation frequency of the 70 nm Ni—glass sample
Grahic Jump Location
Schematic diagram of the photoacoustic apparatus
Grahic Jump Location
Phase shift as a function of the modulation frequency of the 70 nm Ni—484.5 nm SiO2—Si sample
Grahic Jump Location
Thermal conductivity of SiO2 films obtained by phase shift fitting
Grahic Jump Location
Normalized amplitude as a function of the modulation frequency of the 70 nm Ni—484.5 nm SiO2—Si sample
Grahic Jump Location
Thermal conductivity of SiO2 films obtained by amplitude fitting
Grahic Jump Location
Phase shift as a function of the modulation frequency of the 999.5 nm Ni—Si sample
Grahic Jump Location
Normalized amplitude as a function of the modulation frequency of the 999.5 nm Ni—Si sample

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