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TECHNICAL PAPERS: Microscale Heat Transfer

Photo-Acoustic Measurement of Thermal Conductivity of Thin Films and Bulk Materials

[+] Author and Article Information
Xinwei Wang, Hanping Hu, Xianfan Xu

School of Mechanical Engineering, Purdue University, West Lafayette, IN 47907

J. Heat Transfer 123(1), 138-144 (Jun 25, 2000) (7 pages) doi:10.1115/1.1337652 History: Received October 25, 1999; Revised June 25, 2000
Copyright © 2001 by ASME
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References

Figures

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Schematic diagram of the photoacoustic apparatus
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Phase shift as a function of the modulation frequency of the 70 nm Ni—484.5 nm SiO2—Si sample
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Thermal conductivity of SiO2 films obtained by phase shift fitting
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Normalized amplitude as a function of the modulation frequency of the 70 nm Ni—484.5 nm SiO2—Si sample
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Thermal conductivity of SiO2 films obtained by amplitude fitting
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Phase shift as a function of the modulation frequency of the 999.5 nm Ni—Si sample
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Normalized amplitude as a function of the modulation frequency of the 999.5 nm Ni—Si sample
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Normalized amplitude as a function of the modulation frequency of the 70 nm Ni—glass sample
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Schematic diagram of the apparatus for measuring diffuse reflectivity
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Normalized amplitude as a function of the modulation frequency of Sample #1787

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