0
TECHNICAL PAPERS: Heat Transfer in Manufacturing

Incandescence Measurement During CO2 Laser Texturing of Silicate Glass

[+] Author and Article Information
Lei Li, Ted D. Bennett

Department of Mechanical and Environmental Engineering, University of California, Santa Barbara, CA 93106

J. Heat Transfer 123(2), 376-381 (Nov 21, 2000) (6 pages) doi:10.1115/1.1351166 History: Received March 08, 2000; Revised November 21, 2000
Copyright © 2001 by ASME
Your Session has timed out. Please sign back in to continue.

References

Rauch,  G. C., Liu,  J. J., Lee,  S. Y., Boszormenyi,  I., Chuan,  G., Jing,  G., Kuo,  D., Marchon,  B., Vierk,  S., and Malmhall,  R., 1996, “Glass-Ceramic Substrates for 1 Gb/in2 and Beyond,” IEEE Trans. Magn., 32, pp. 3642–3647.
Teng,  E., Goh,  W., and Eltouhky,  A., 1996, “Laser Zone Texture on Alternative Substrate Disks,” IEEE Trans. Magn., 32, pp. 3759–3761.
Kuo,  D., Gui,  J., Marchon,  B., Lee,  S., Boszormenyi,  I., Liu,  J. J., Rauch,  G. C., Vierk,  S., and Meyer,  D., 1996, “Design of Laser Zone Texture for Low Glide Media,” IEEE Trans. Magn., 32, No. 5:1, pp. 3753–3758.
Tam,  A. C., Brannon,  J., Baumgart,  P., and Pour,  I. K., 1997, “Laser Texturing of Glass Disk Substrates,” IEEE Trans. Magn., 33, No. 5:1, pp. 3181–3183.
Bennett,  T. D., Krajnovich,  D. J., Li,  L., and Wan,  D., 1998, “Mechanism of Topography Formation During CO2 Laser Texturing of Silicate Glasses,” J. Appl. Phys., 84, No. 5, pp. 2897–2905.
Bennett,  T. D., Krajnovich,  D. J., and Li,  L., 1999, “Thermophysical Modeling of Bump Formation During CO2 Laser Texturing of Silicate Glasses,” J. Appl. Phys., 85, No. 1, pp. 153–159.
Jones, G. O., and Parke, S., 1971, Glass, 2nd ed., Chapman and Hall, London.
Maglic,  K. D., and Marsicanin,  B. S., 1973, “Factors Affecting the Accuracy of Transient Response of Intrinsic Thermocouples in Thermal Diffusivity Measurement,” High Temp.-High Press., 5, No. 1, pp. 105–110.
Baeri,  P., Campisano,  S. U., Rimini,  E., and Jing Ping,  Z., 1984, “Time Resolves Temperature Measurement of Pulsed Laser Irradiated Germanium by Thin Film Thermocouple,” Appl. Phys. Lett., 45, No. 4, pp. 398–400.
Zenobi,  R., Hahn,  J. H., and Zare,  R. N., 1988, “Surface Temperature Measurement of Dielectric Materials Heated by Pulsed Laser Radiation,” Chem. Phys. Lett., 150, No. 5, pp. 361–365.
Shanov,  V., Petkov,  P., Ivanov,  B., Popov,  C., and Vodenicharov,  C., 1994, “Sensor for Temperature Measurement of Laser Heated Surfaces,” Vacuum, 45, No. 12, pp. 1187–1189.
Xu,  X., Grigoropoulos,  C. P., and Russo,  R. E., 1995, “Transient Temperature During Pulsed Excimer Laser Heating of Thin Polysilicon Films Obtained by Optical Reflectivity Measurement,” ASME J. Heat Transfer, 117, No. 1, pp. 17–24.
Larson,  B. C., White,  C. W., Noggle,  T. S., Barhorst,  J. F., and Mills,  D. M., 1983, “Time-Resolved X-Ray Diffraction Measurement of the Temperature and Temperature Gradients in Silicon During Pulsed Laser Annealing,” Appl. Phys. Lett., 42, No. 3, pp. 282–284.
Pui-Kwong,  C., and Hart,  T. R., 1989, “Raman Scattering Temperature Probe of Laser Disk Marking,” Appl. Opt., 28, No. 9, pp. 1685–1691.
Morozova,  E. A., Shafeev,  G. A., and Wautelet,  M., 1992, “Interferometric Measurement of Lateral Temperature Distribution During Laser-Assisted Processing of Thin Films,” Meas. Sci. Technol., 3, No. 3, pp 302–305.
Mann,  S. S., Todd,  B. D., Stuckless,  J. T., Seto,  T., and King,  D. A., 1991, “Pulsed Laser Surface Heating: Nanosecond Time-Scale Temperature Measurement,” Chem. Phys. Lett., 183, No. 6, pp. 529–533.
Schafer,  B., and Bostanjoglo,  O., 1993, “Tracing Fast Changing Temperature on Laser-Pulsed Metal Surfaces by Micropyrometry,” Rev. Sci. Instrum., 64, No. 12, pp. 3598–3601.
Holmes,  N. C., 1995, “Fiber-Coupled Optical Pyrometer for Shock-Wave Studies,” Rev. Sci. Instrum., 66, No. 3, pp. 2615–2618.
Xu,  X., Grigoropoulos,  C. P., and Russo,  R. E., 1996, “Nanosecond-Time-Resolution Thermal Emission Measurement During Pulsed Excimer-Laser Interaction With Materials,” Appl. Phys. A: Mater. Sci. Process., A62, No. 1, pp. 51–59.
Nettesheim,  S., and Zenobi,  R., 1996, “Pulsed Laser Heating of Surfaces: Nanosecond Timescale Temperature Measurement Using Black Body Radiation,” Chem. Phys. Lett., 255, No. 1–3, pp. 39–44.
Otte,  D., Kleinschmidt,  H., and Bostanjoglo,  O., 1997, “Space and Time Resolved Temperature Measurements in Laser Pulse-Produced Metal Melts,” Rev. Sci. Instrum., 68, No. 6, pp. 2534–2537.

Figures

Grahic Jump Location
Comparison between old and new numerical models: (a) pulse shape of CO2 laser pulse; and (b) temperature dependence of thermal conductivity (left axis) and imaginary refractive index at the wavelength of the laser (right axis)
Grahic Jump Location
Optical microscope image of laser texture bumps on silicate glass
Grahic Jump Location
Experimental setup for visible emission measurements
Grahic Jump Location
Time resolved emission measurements at 550 nm for different pulse energies
Grahic Jump Location
Peak intensity as a function of pulse energy for different wavelengths. Scattered symbols represent experimental data; solid lines show least square fit to data.
Grahic Jump Location
Reciprocal of extensive heat capacity versus emission wavelength. Experimentally determined values are compared with numerically calculated values based on Eq. (6).
Grahic Jump Location
Peak emission temperature as a function of pulse energy for five wavelengths. Panels (a) and (b) show experimental and numerical results, respectively. Error bars show the temperature uncertainty, as derived from the uncertainty in the measured extensive heat capacities reported in Fig. 6.
Grahic Jump Location
Transient temperatures for the corresponding emission curves presented in Fig. 4. Experimental uncertainty is approximately 15 percent of the temperature value.
Grahic Jump Location
Comparison of numerically calculated (solid lines) and experimentally measured (solid circles) emission temperatures. For temporal comparison, hollow squares show experimental results scaled with numerical results. Shaded regions show the temperature uncertainty, as derived from the uncertainty in the measured extensive heat capacities reported in Fig. 6.

Tables

Errata

Discussions

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In