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TECHNICAL PAPERS

Thermal Transport Mechanisms at Nanoscale Point Contacts

[+] Author and Article Information
Li Shi, Arunava Majumdar

Department of Mechanical Engineering, University of California, Berkeley, CA 94720

J. Heat Transfer 124(2), 329-337 (Jul 27, 2001) (9 pages) doi:10.1115/1.1447939 History: Received February 08, 2001; Revised July 27, 2001
Copyright © 2002 by ASME
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References

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Figures

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Schematic diagram of a SThM probe in contact with a Joule heated metal line. Also shown are various tip-sample heat transfer mechanisms.
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Cross section (upper left) and scanning electron micrographs of a SThM probe (upper right), the probe tip (lower left), and the Pt-Cr junction (lower right) at the end of the tip
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Thermoelectric voltage as a function of temperature difference between the Pt-Cr junction and the contact pads. The inset shows the measurement setup
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Topographic (a) and thermal (b) images of a 350 nm wide Au line. One of the four leads to the Au line is located on top of the line and is not shown in the figure.
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Four-probe resistance of the Au line as a function of temperature
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Temperature of the Au line as a function of current
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Temperature rise in the Pt-Cr junction as a function of temperature rise in the 350 nm wide line in contact with the probe tip
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Temperature rise in the Pt-Cr junction as a function of temperature rise in the 5.8 μm wide line in contact with the probe tip
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Cantilever deflection and temperature response of the probe as a function of sample vertical position when the 350 nm wide line was raised toward and then retracted from the tip
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A schematic diagram showing the contact between an asperity on the tip end and the sample
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Cantilever deflection and temperature response of the probe as a function of sample vertical position when the 5.8 μm wide line approached and then retracted from the tip
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Modeled temperature profile along the X and Y axis on the substrate of the 350 nm wide line. The inset shows the computation domain.
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Electrical resistivity as a function of the thickness of the Pt and Cr films
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Modeled and measured temperature responses of the probe as a function of sample vertical position when the 350 nm wide line approached the tip
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Temperature in the tip as a function of y for different tip and cantilever materials
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Modeled temperature profile, predicted SThM-measured temperature and actual SThM measured temperature and height profiles across the 350 nm wide line

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