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RESEARCH PAPERS: Conduction

Solution of Transient Temperature Field for Thermographic NDT Under Joule Effect Heating

[+] Author and Article Information
Zhuo Qiu Li, Xiong Zhang, Jiang Tao Zhang

School of Science, Wuhan University of Technology, 430070, Wuhan, China

J. Heat Transfer 127(7), 670-674 (Jan 06, 2005) (5 pages) doi:10.1115/1.1924625 History: Received February 24, 2004; Revised January 06, 2005

Conducting infrared thermographic nondestructive testing (NDT) by the internal heat generated by Joule effect of components is a new heating approach for flaw detection. Due to the combination of electric field and thermal field, the irregular geometric boundary and the complicated internal heat source distribution, the theoretical solution of transient temperature field is very difficult. Nowadays numerical solution by FEM and FDM is mainly applied. By adopting certain assumptions, this paper presents a method to obtain the approximate temperature field by using Green’s function, and gives the solution of a two-dimensional rectangular field including a circular flaw. By contrast, the result tallies with the FEM results well.

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Copyright © 2005 by American Society of Mechanical Engineers
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Figures

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Figure 1

Experimental set-up

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Figure 2

Representative result

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Figure 3

Simplification of the model

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Figure 4

Schematic of coordinate system

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Figure 5

Joule heat distribution

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Figure 6

Joule heat along axis x

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Figure 7

Joule heat along axis y

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Figure 8

Dividing the region into three parts

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Figure 9

(a) Solution of FEM; (b) solution of the analytical expression

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Figure 10

Contrast curve of surface temperature (c=10mm)

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Figure 11

Contrast curve of surface temperature (c=20mm)

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