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MICRO/NANOSCALE HEAT TRANSFER—PART I

Semiconductor Thin Films Combined With Metallic Grating for Selective Improvement of Thermal Radiative Absorption/Emission

[+] Author and Article Information
C. J. Fu1

LTCS and Department of Mechanics and Aerospace Engineering, College of Engineering, Peking University, Beijing 100871, Chinacjfu@pku.edu.cn

W. C. Tan

LTCS and Department of Mechanics and Aerospace Engineering, College of Engineering, Peking University, Beijing 100871, China

1

Corresponding author.

J. Heat Transfer 131(3), 033105 (Jan 21, 2009) (8 pages) doi:10.1115/1.3056599 History: Received January 28, 2008; Revised July 22, 2008; Published January 21, 2009

We propose in this work a structure of semiconductor thin films combined with a one-dimensional metallic grating, which allows for selective improvement of thermal radiative absorptivity (also emissivity) of the structure. Both shallow and deep gratings are considered in this work. Our numerical results obtained with a 2D rigorous coupled-wave analysis algorithm demonstrate that the proposed structure exhibits enhanced spectral absorptivity for photon energy slightly above the gap energy of the semiconductor (silicon in this work). Furthermore, the selectively improved absorptivity can be obtained in a wide range of incidence angles. As such, much smaller thickness of the semiconductor layer is required to absorb the same amount of high energy photons than in a conventional Si-based photovoltaic device. In addition, absorptivity for low energy photons in the new structure is lower due to the smaller semiconductor layer thickness. Therefore, the new structure may have potential applications in energy conversion devices.

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Copyright © 2009 by American Society of Mechanical Engineers
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References

Figures

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Figure 1

Schematic of the proposed structure, also shown are the relative orientations of the electric field vector E, magnetic field vector H, and wave vector k

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Figure 2

(a) Comparison of the calculated first-order transmissivity (curves) of a sawtoothlike dielectric grating with published results (markers); (b) comparison of the calculated absorptivity of the proposed structure for normal incidence by the RCWA method (solid curves) and by the formulas of thin film optics (dots) when d3=0

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Figure 3

(a) Calculated absorptivity of the structure at normal incidence for Cases 2–4 listed in Table 1; (b) calculated absorptivity of the structure at incidence angles equal to 30 deg and 60 deg, respectively, for Case 3

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Figure 4

Calculated absorptivity of the structure as a function of incidence angle at wavelength λ=1.033 μm for Cases 2 (dotted), 3 (solid), and 4 (dashed), respectively

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Figure 5

The dispersion curves of SPs at the interface between silicon and silver (solid) and between vacuum and silver (dotted). The dashed curves (I) and (II) are, respectively, the dispersion curves for light propagating in vacuum and silicon.

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Figure 6

Magnetic field amplitude distributions in the silicon layer of Case 3 for (a) θ=0 deg and (b) θ=36 deg; a very large field amplitude can be seen in the region close to the grating in both figures, but the field amplitude distribution in (b) is much more complicated compared with that in (a)

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Figure 7

Absorptivity of Case 3 (with grating) and Case 4 (without grating) for incidence of s-polarization versus the incidence angle θ

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Figure 8

Calculated absorptivity of Case 5 compared with that of Case 2 for plane wave at normal incidence

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Figure 9

Comparison of absorptivity of Case 5 to that of Case 4 at wavelength λ=1.033 μm and various incidence angles: (a) s-polarization and (b) p-polarization

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Figure 10

Calculated (a) electric field amplitude distribution and (c) energy flux in the Si layer and the grating region of Case 5 for s-polarized plane wave at normal incidence. (b) and (d) show, respectively, enlarged electric field amplitude distribution and energy flux in the grating region.

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Figure 11

Calculated (a) magnetic field amplitude distribution and (c) energy flux in the Si layer and the grating region of Case 5 for p-polarized plane wave at incidence angle of 8 deg. (b) and (d) show, respectively, enlarged magnetic field amplitude distribution and energy flux in the grating region.

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