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Research Papers

A Hybrid Partial Coherence and Geometry Optics Model of Radiative Property on Coated Rough Surfaces

[+] Author and Article Information
Jun Qiu

School of Energy Science and Engineering,
Harbin Institute of Technology,
Harbin 150001, Heilongjiang, China;
Mechanical and Aerospace Engineering Department,
Florida Institute of Technology,
Melbourne, FL 32901
e-mail: qiujun8326@163.com

Yuan Ting Wu

Mechanical and Aerospace Engineering Department,
Florida Institute of Technology,
Melbourne, FL 32901
e-mail: wuy2009@my.fit.edu

Zhifeng Huang

State Key Laboratory of Coal Combustion,
Huazhong University of Science and Technology,
Wuhan 430074, Hubei, China
e-mail: zhifhuang@gmail.com

Pei-Feng Hsu

Mechanical and Aerospace Engineering Department,
Florida Institute of Technology,
Melbourne, FL 32901;
School of Mechanical Engineering,
Shanghai Dianji University,
Shanghai 201306, China
e-mail: phsu@fit.edu

Lin-Hua Liu

School of Energy Science and Engineering,
Harbin Institute of Technology,
Harbin 150001, Heilongjiang, China
e-mail: lhliu@hit.edu.cn

Huai-Chun Zhou

Department of Thermal Engineering,
Tsinghua University,
Haidian, Beijing 100084, China
e-mail: hczh@mail.tsinghua.edu.cn

1Corresponding author.

Contributed by the Heat Transfer Division of ASME for publication in the Journal of Heat Transfer. Manuscript received June 30, 2012; final manuscript received February 19, 2013; published online July 26, 2013. Assoc. Editor: Zhuomin Zhang.

J. Heat Transfer 135(9), 091503 (Jul 26, 2013) (6 pages) Paper No: HT-12-1333; doi: 10.1115/1.4024466 History: Received June 30, 2012; Revised February 19, 2013

Thermal and optical engineering applications of electromagnetic wave scattering from rough surfaces include temperature measurement, radiation heating process, etc. Most of the surfaces have random roughness and are often with coating material different from the substrate. However, the understanding of radiative properties of coated rough surfaces is not well addressed at this point. This paper presented a novel hybrid partial coherence and geometry optics (HPCGO) model to improve the generic geometry optics (GO) prediction by incorporating a previously developed partial coherence reflectance equation. In this way, HPCGO expands the applicable region of GO model and largely reduces the computation time of integrating different wavelength results in the regular hybrid model that considers coherence effect only. In this study, the HPCGO model is first compared with the more rigorous Maxwell equations solvers, the finite-difference time-domain (FDTD) method, and integral equation (IE) method. Then, the HPCGO model is applied to study the coherent effect of directional-hemispherical reflectance from coated rough surfaces. It is found the roughness of coated rough surface can cause partially coherent or noncoherent scattered light even if the incident light source is coherent. It also shows the reflected electromagnetic wave's coherence effect reduces with increased coating thickness and surface roughness, besides the previously recognized incident wave-number bandwidth. The effect of reduce coherence in scattered wave is quantified. Finally a regime map, even limited in the roughness and coating thickness dimensionless parameter ranges, provides the region of validity of the HPCGO model.

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Figures

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Fig. 1

Coated film has identical surface roughness profile with base material (σ = 4 μm, τ = 10 μm, and h = 2 μm)

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Fig. 2

Directional-hemispherical reflectance of σ/τ = 0.4 rough silicon surface coated with a silicon dioxide film, calculated by HPCGO

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Fig. 3

BRDF of 1-D rough silicon surface coated with silicon dioxide film. (Symbols: ○, h/λ = 2; x, h/λ = 1; □, h/λ = 1/2).

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Fig. 4

Directional-hemispherical reflectance of σ/τ = 0.2 rough silicon surface coated with a silicon dioxide film of coherent, normal incident of light

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Fig. 5

Directional-hemispherical reflectance of σ/τ = 0.4 rough silicon surface coated with a silicon dioxide film of coherent, normal incident of light

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Fig. 6

HPCGO and FDTD prediction of directional-hemispherical reflectance of rough silicon surface coated with a silicon dioxide film (coherent light source)

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Fig. 7

Percentage error and applicable region of HPCGO prediction in directional-hemispherical reflectance of rough silicon surface coated with a silicon dioxide film (coherent light source)

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