0
Research Papers: Conduction

Measurement of High-Performance Thermal Interfaces Using a Reduced Scale Steady-State Tester and Infrared Microscopy

[+] Author and Article Information
Andrew N. Smith

Mem. ASME
U.S. Naval Academy,
Annapolis, MD 21402
e-mail: ansmith@usna.edu

Nicholas R. Jankowski

Mem. ASME
U.S. Army Research Laboratory,
Adelphi, MD 20783
e-mail: nicholas.r.jankowski.civ@mail.mil

Lauren M. Boteler

U.S. Army Research Laboratory,
Adelphi, MD 20783
e-mail: lauren.m.boteler.civ@mail.mil

1Corresponding author.

Contributed by the Heat Transfer Division of ASME for publication in the JOURNAL OF HEAT TRANSFER. Manuscript received March 16, 2015; final manuscript received September 30, 2015; published online January 20, 2016. Assoc. Editor: Laurent Pilon.This material is declared a work of the U.S. Government and is not subject to copyright protection in the United States. Approved for public release; distribution is unlimited.

J. Heat Transfer 138(4), 041301 (Jan 20, 2016) (7 pages) Paper No: HT-15-1199; doi: 10.1115/1.4032172 History: Received March 16, 2015; Revised September 30, 2015

Thermal interface materials (TIMs) have reached values approaching the measurement uncertainty of standard ASTM D5470 based testers of approximately ±1 × 10−6 m2 K/W. This paper presents a miniature ASTM-type steady-state tester that was developed to address the resolution limits of standard testers by reducing the heat meter bar thickness and using infrared (IR) thermography to measure the temperature gradient along the heat meter bar. Thermal interfacial resistance measurements on the order of 1 × 10−6 m2 K/W with an order of magnitude improvement in the uncertainty of ±1 × 10−7 m2 K/W are demonstrated. These measurements were made on several TIMs with a thermal resistance as low as 1.14 × 10−6 m2 K/W.

FIGURES IN THIS ARTICLE
<>
Copyright © 2016 by ASME
Your Session has timed out. Please sign back in to continue.

References

Figures

Grahic Jump Location
Fig. 1

Chip resistor and the upper and lower heat meter bars positioned on a water-cooled heat sink

Grahic Jump Location
Fig. 2

comsol simulation of the heat flow through the heat meter bars with an interfacial resistance of 1 × 10 −6 m2 K/W including convective heat loss where h = 10 W/m2K

Grahic Jump Location
Fig. 3

Isotherm and heat flux contours for the comsol simulation demonstrate that the heat flow is one-dimensional through the interface

Grahic Jump Location
Fig. 4

Surface temperature near the interface (X = 0) based on the comsol simulation

Grahic Jump Location
Fig. 5

Linear temperature profile across the comsol simulated interface shown for the centerline of the face, the outer corner, and averaged across the Y direction

Grahic Jump Location
Fig. 6

Using comsol simulated surface temperatures resulted in a calculated contact resistance of 0.9997 × 10 −6 m2 K/W which represents a 0.03% error

Grahic Jump Location
Fig. 7

Influence of surface convective losses on the measured contact resistance. Percent error is based on agreement with the contact resistance of 1 × 10 −6 m2 K/W used in the simulation.

Grahic Jump Location
Fig. 8

(a) IR image used to measure the temperatures (°C) of the upper and lower heat meter bars. (b) Portion of the IR image used to determine the contact resistance.

Grahic Jump Location
Fig. 12

Measured interfacial resistance of Arctic Silver® 5 and 4 mil Heat-Spring® as a function of contact pressure

Grahic Jump Location
Fig. 11

Measured Arctic Silver® 5 contact resistance of (13.7±1) × 10 −6 m2 K/W for a contact pressure of 1.4 MPa

Grahic Jump Location
Fig. 10

Measured Heat-Spring® contact resistance of (7.9±0.7) × 10 −6 m2 K/W for a contact pressure of 1.4 MPa

Grahic Jump Location
Fig. 9

Measured contact resistance of (1.61±0.9) × 10 −6 m2 K/W for a 65 μm Cu/AuSn/Cu interface

Tables

Errata

Discussions

Some tools below are only available to our subscribers or users with an online account.

Related Content

Customize your page view by dragging and repositioning the boxes below.

Related Journal Articles
Related eBook Content
Topic Collections

Sorry! You do not have access to this content. For assistance or to subscribe, please contact us:

  • TELEPHONE: 1-800-843-2763 (Toll-free in the USA)
  • EMAIL: asmedigitalcollection@asme.org
Sign In