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Research Papers: Heat and Mass Transfer

Theoretical Adjustment of Necessary Conditions for Enhancing Figure of Merit of Thin Thermoelectric Layers

[+] Author and Article Information
Taher Ghrib

Laboratory of Physical Alloys (LPA),
College of Science,
University of Dammam,
Dammam 31113, Saudi Arabia;
Laboratoire Photovoltaïque,
Centre de Recherches et des Technologies de
l'Energie Technopole Borj Cedria,
Hammam Lif 2050, Tunisia
e-mail: taher.ghrib@yahoo.fr

Munirah Abdullah Almessiere, Amal Lafy Al-Otaibi, Sami Brini

Laboratory of Physical Alloys (LPA),
College of Science,
University of Dammam,
Dammam 31113, Saudi Arabia

Radhouane Chtourou

Laboratoire Photovoltaïque,
Centre de Recherches et des Technologies de
l'Energie Technopole Borj Cedria,
Hammam Lif 2050, Tunisia

1Corresponding author.

Contributed by the Heat Transfer Division of ASME for publication in the JOURNAL OF HEAT TRANSFER. Manuscript received August 19, 2015; final manuscript received February 15, 2017; published online May 2, 2017. Assoc. Editor: Ali Khounsary.

J. Heat Transfer 139(9), 092001 (May 02, 2017) (7 pages) Paper No: HT-15-1553; doi: 10.1115/1.4036039 History: Received August 19, 2015; Revised February 15, 2017

This work presents a simple method based on electrical and thermal properties of materials. It permits researchers, in the field of manufacturing and characterization of thin and thick films in solid state to take appropriate experimental conditions before the preparation process. The calculation of the thermal diffusion length, its comparison with thicknesses of the substrate, the thin layer deposited on the substrate, the use of photothermal deflection technique, and the Cahill's law permit to highlight the necessary conditions that allow researchers to manufacture samples with high thermoelectric power such as the required thickness, electric conductivity, and thermal conductivity.

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References

Figures

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Fig. 1

Deflection of a probe beam passing through a graded index area in the fluid nearby the heated sample

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Fig. 2

Variations in the amplitude and phase of the photothermal signal for a conductivity Kc = 0.1 W/m and lc = 100 μm for different values of thermal diffusivity Dc

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Fig. 3

The normalized amplitude and the phase of the signal for a layer thickness lc = 100 μm and Dc = 1 × 10−6 m2/s

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Fig. 4

Variation of the amplitude and phase of the signal for a layer with a thermal diffusivity Dc = 1.5 × 10−6 m2 s−1, a thickness lc = 2 μm, and different thermal conductivity values

Grahic Jump Location
Fig. 5

Variation of the amplitude and phase of the signal for a layer with a thermal conductivity Kc = 0.35 W m−1 K−1, a thickness lc = 2 μm, and different thermal diffusivity values

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Fig. 6

Variation of the amplitude and phase of the signal for a layer thickness lc = 100 μm for different metals

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Fig. 7

The signal becomes very sensitive to the properties of materials with a thin layer of thickness lc = 2μm for a substrate of thickness ls = 1 mm

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Fig. 8

Theoretical variation of the lattice thermal conductivity with the decimal logarithm of the material atoms' density (a) and variation of Seebeck coefficient with the Fermi energy (b)

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