Research Papers: Radiative Heat Transfer

Experimental Demonstration of the Effect of Magnetic Polaritons on the Radiative Properties of Deep Aluminum Gratings

[+] Author and Article Information
Peiyan Yang

George W. Woodruff School of Mechanical
Georgia Institute of Technology,
Atlanta, GA 30332

Hong Ye

Department of Thermal Science and Energy
University of Science and Technology of China,
Hefei, Anhui 230027, China

Zhuomin M. Zhang

George W. Woodruff School of Mechanical
Georgia Institute of Technology,
Atlanta, GA 30332
e-mail: zhuomin.zhang@me.gatech.edu

1Corresponding author.

Contributed by the Heat Transfer Division of ASME for publication in the JOURNAL OF HEAT TRANSFER. Manuscript received July 11, 2018; final manuscript received January 10, 2019; published online March 27, 2019. Assoc. Editor: Debjyoti Banerjee.

J. Heat Transfer 141(5), 052702 (Mar 27, 2019) (8 pages) Paper No: HT-18-1444; doi: 10.1115/1.4042698 History: Received July 11, 2018; Revised January 10, 2019

Despite the abundant theoretical studies of magnetic polaritons (MPs) in tailoring the radiative properties of nanostructures, experimental investigation of MPs in deep metal gratings is still lacking. This work experimentally demonstrates the excitation of MP from several microfabricated aluminum gratings in the mid-infrared region by measuring the specular reflectance (zeroth-order diffraction) of the specimen using a Fourier-transform infrared (FTIR) spectrometer. The rigorous coupled-wave analysis (RCWA) and an LC-circuit model are employed to elucidate the mechanism of various resonant modes and their coupling effect. The influence of incidence angle, plane of incidence, polarization, and the trench depth on the spectral reflectance is also discussed. Moreover, the MP dispersion for off-plane layout has been investigated and demonstrated for the first time. The insight gained from this work may facilitate future design and applications of subwavelength periodic structures with desired radiative properties.

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Grahic Jump Location
Fig. 1

Schematic of the polarization and orientation in the FTIR measurement for (a) in-plane layout, where the plane of incidence of a TM wave is perpendicular to the grooves and (b) off-plane layout, where the plane of incidence of a TE wave is perpendicular to the grating vector which is in the x-direction

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Fig. 2

Scanning electron microscopy images of sample AL02 with indication of measurements of (a) the periods and (b) trench/ridge widths. Measurements of the period are intentionally repeated to indicate statistical variations.

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Fig. 3

(a) Comparison of the measured spectral reflectance of sample AL01 at incidence angle of 10 deg for the in-plane layout with that calculated considering zeroth-order only and (b) calculated reflectance of sample AL01 considering the zeroth diffraction order plus additional few diffraction orders

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Fig. 4

Contour plot for 1−R0 (where R0 is the reflectance for the zeroth-order diffraction) for sample AL01 with respect to the wavenumber and the parallel wavevector of the incident wave: (a) in-plane layout and (b) off-plane layout

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Fig. 5

Comparison of calculated and measured reflectance of sample AL01: (a)–(c) in-plane layout with θ= 10 deg, 30 deg, and 45 deg, respectively, for TM wave incidence; (d)–(f) off-plane layout with θ= 10 deg, 30 deg, and 45 deg, respectively, for TE wave incidence

Grahic Jump Location
Fig. 6

Measured MP resonance of all three samples at 10 deg incidence angle: (a) in-plane layout for TM wave incidence and (b) off-plane layout for TE wave incidence

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Fig. 7

Contour plot for 1−R0 calculated with varying trench depth (or grating height) when the rest parameters are fixed as for AL01: (a) in-plane layout for TM wave incidence and (b) off-plane layout for TE wave incidence



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