Use of Scanning Microphotometer to Determine the Evaporative Heat Transfer Characteristics of the Contact Line Region

[+] Author and Article Information
R. Cook, C. Y. Tung, P. C. Wayner

Department of Chemical Engineering, Rensselaer Polytechnic Institute, Troy, N.Y. 12181

J. Heat Transfer 103(2), 325-330 (May 01, 1981) (6 pages) doi:10.1115/1.3244461 History: Received September 08, 1980; Online October 20, 2009


A scanning microphotometer was used to measure in situ the profile of an evaporating decane meniscus in the contact line region on a smooth inclined silicon substrate as a function of the evaporative heat flux. The use of this new experimental design to determine the effect of heat flux on the profile in the contact line region is discussed. The results support the hypothesis that fluid flow in the contact line region of an evaporating thin film results from a change in the thin film thickness profile.

Copyright © 1981 by ASME
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