Experimental Study of Evaporation in the Contact Line Region of a Thin Film of Hexane

[+] Author and Article Information
P. C. Wayner, C. Y. Tung, M. Tirumala, J. H. Yang

Department of Chemical Engineering and Environmental Engineering, Rensselaer Polytechnic Institute, Troy, N.Y. 12181

J. Heat Transfer 107(1), 182-189 (Feb 01, 1985) (8 pages) doi:10.1115/1.3247376 History: Received August 29, 1983; Online October 20, 2009


The transport processes in the contact line region (junction of evaporating thin liquid film, vapor, and substrate) of stationary steady-state evaporating thin films of hexane with various bulk compositions were studied experimentally. The substrate temperature distribution and liquid film thickness profile were measured, analyzed, and compared with previous results on other systems. The results demonstrate that small changes in the bulk composition significantly alter the characteristics of the transport processes in the contact line region. The curvature gradient at the liquid-vapor interface is a strong function of evaporation rate and composition. Concentration and temperature gradients give interfacial shear stresses and flow patterns that enhance contact line stability.

Copyright © 1985 by ASME
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