Electrical component assemblies are encapsulated to provide delicate parts with voltage isolation and protection against damage. The stresses generated by cure shrinkage, although typically smaller than the thermal residual stresses produced by cooling, can cause delamination or fractures in an encapsulant. Mechanical failures can be reduced by optimizing the encapsulation process or altering the component geometry. This paper documents the performance of rubbery constitutive equations in analyzing the stresses and strains generated by isothermal curing. A rubbery cure shrinkage model was installed in a finite element program and material inputs were obtained by measuring the rubbery shear modulus and volumetric shrinkage of a gelled epoxy during isothermal curing at several temperatures. A test was performed to measure the structural response produced by curing, and the data were compared to finite element predictions. The rubbery model performs well when the glass transition temperature of the curing epoxy does not exceed the cure temperature.
Skip Nav Destination
Article navigation
September 1995
Technical Briefs
A Rubbery Cure Shrinkage Model for Analyzing Encapsulated Assemblies
R. S. Chambers,
R. S. Chambers
MS 0443, Sandia National Laboratories, Albuquerque, New Mexico 87185
Search for other works by this author on:
R. R. Lagasse,
R. R. Lagasse
MS 0443, Sandia National Laboratories, Albuquerque, New Mexico 87185
Search for other works by this author on:
T. R. Guess,
T. R. Guess
MS 0443, Sandia National Laboratories, Albuquerque, New Mexico 87185
Search for other works by this author on:
D. J. Plazek,
D. J. Plazek
Department of Materials Science and Engineering, University of Pittsburgh, Pittsburgh, PA
Search for other works by this author on:
C. Bero
C. Bero
Department of Materials Science and Engineering, University of Pittsburgh, Pittsburgh, PA
Search for other works by this author on:
R. S. Chambers
MS 0443, Sandia National Laboratories, Albuquerque, New Mexico 87185
R. R. Lagasse
MS 0443, Sandia National Laboratories, Albuquerque, New Mexico 87185
T. R. Guess
MS 0443, Sandia National Laboratories, Albuquerque, New Mexico 87185
D. J. Plazek
Department of Materials Science and Engineering, University of Pittsburgh, Pittsburgh, PA
C. Bero
Department of Materials Science and Engineering, University of Pittsburgh, Pittsburgh, PA
J. Electron. Packag. Sep 1995, 117(3): 249-254 (6 pages)
Published Online: September 1, 1995
Article history
Received:
October 18, 1992
Revised:
October 14, 1994
Online:
November 6, 2007
Citation
Chambers, R. S., Lagasse, R. R., Guess, T. R., Plazek, D. J., and Bero, C. (September 1, 1995). "A Rubbery Cure Shrinkage Model for Analyzing Encapsulated Assemblies." ASME. J. Electron. Packag. September 1995; 117(3): 249–254. https://doi.org/10.1115/1.2792101
Download citation file:
Get Email Alerts
Cited By
Sequential Versus Concurrent Effects in Combined Stress Solder Joint Reliability
J. Electron. Packag
Anand Model Constants of Sn-Ag-Cu Solders: What Do They Actually Mean?
J. Electron. Packag
Related Articles
Hygrothermal Damage in Graphite/Epoxy Laminates
J. Eng. Mater. Technol (January,1987)
Numerical and Experimental Study of Interface Delamination in Flip Chip BGA Package
J. Electron. Packag (March,2010)
Nonlinear Viscoelastic Finite Element Analysis of Physical Aging in an Encapsulated Transformer
J. Electron. Packag (March,2009)
Finite Element Analysis of Stress Singularities in Attached Flip Chip Packages
J. Electron. Packag (December,2000)
Related Proceedings Papers
Related Chapters
In Situ Observations of the Failure Mechanisms of Hydrided Zircaloy-4
Zirconium in the Nuclear Industry: 20th International Symposium
Introduction and Definitions
Handbook on Stiffness & Damping in Mechanical Design
Understanding the Problem
Design and Application of the Worm Gear