The damage mechanisms of carbon nanotubes are considered to be the oxidation by Joule heating and migration of carbon atoms by high-density electron flows. In this study, a high current density testing system was designed and applied to multiwalled carbon nanotubes (MWCNTs) collected at the gap between thin-film electrodes. Local evaporation of carbon atoms occurred on the cathode side of the MWCNTs under relatively low current density conditions, and the center area of the MWCNTs under high current density conditions. The damaged morphology could be explained by considering both Joule heating and electromigration behavior of MWCNTs.
Issue Section:
Research Papers
References
1.
Iijima
, S.
, 1991
, “Helical Microtubules of Graphitic Carbon
,” Nature
, 354
(6348), pp. 56
–58
.10.1038/354056a02.
Yokoyama
, D.
, Iwasaki
, T.
, Yoshida
, T.
, and Kawarada
, H.
, 2007
, “Low Temperature Grown Carbon Nanotube Interconnects Using Inner Shells by Chemical Mechanical Polishing
,” Appl. Phys. Lett.
, 91
(26), p. 263101
.10.1063/1.28243903.
Yao
, Z.
, Kane
, C. L.
, and Dekker
, C.
, 2000
, “High-Field Electrical Transport in Single-Wall Carbon Nanotubes
,” Phys. Rev. Lett.
, 84
(13), pp. 2941
–2944
.10.1103/PhysRevLett.84.29414.
Begtrup
, G. E.
, Ray
, K. G.
, Kessler
B. M.
, Yuzvinsky
, T. D.
, and Garcia
, H.
, 2007
, “Extreme Thermal Stability of Carbon Nanotubes
,” Phys. Status Solidi B
, 244
(11), pp. 3960
–3963
.10.1002/pssb.2007761485.
Collins
, P. G.
, Arnold
, M. S.
, and Avouris
, P.
, 2001
, “Engineering Carbon Nanotubes and Nanotube Circuits Using Electrical Breakdown
,” Science
, 292
(5517), pp. 706
–709
.10.1126/science.10587826.
Tsang
, S. C.
, Harris
, P. J. F.
, and Green
, M. L. H.
, 1993
, “Thinning and Opening of Carbon Nanotubes by Oxidation Using Carbon Dioxide
,” Nature
, 362
(6420), pp. 520
–522
.10.1038/362520a07.
Yuzvinsky
, T. D.
, Mickelson
, W.
, Aloni
, S.
, Begtrup
, G. E.
, Kis
, A.
, and Zettl
, A.
, 2006
, “Shrinking a Carbon Nanotube
,” Nano Lett.
, 6
(12), pp. 2718
–2722
.10.1021/nl061671j8.
Jin
, C.
, Suenaga
, K.
, and Iijima
, S.
, 2008
, “Plumbing Carbon Nanotubes
,” Nat. Nanotechnol.
, 3
(1), pp. 17
–21
.10.1038/nnano.2007.4069.
Verma
, R.
, Bhattacharya
, S.
, and Mahapatra
, S.
, 2012
, “Theoretical Estimation of Electromigration in Metallic Carbon Nanotubes Considering Self-Heating Effect
,” IEEE Trans. Electron Devices
, 59
(9), pp. 2476
–2482
.10.1109/TED.2012.220290910.
Sasagawa
, K.
, Unuma
, J.
, and Abo
, T.
, 2011
, “Effect of Oxygen Concentration on Damage Mechanism of Carbon Nanotubes Under High Current Density
,” ASME
Paper No. IPACK2011-52169.10.1115/IPACK2011-5216911.
Seo
, H. W.
, Han
, C. S.
, Jang
, W. S.
, and Park
, J.
, 2006
, “Manipulation of Carbon Nanotubes and Nanowires
,” Curr. Appl. Phys.
, 6
(S1), pp. 216
–219
.10.1016/j.cap.2006.01.04312.
Sasagawa
, K.
, and Fukushi
, S.
, 2007
, “Evaluation of Threshold Current Density of Electromigration Damage in Angled Bamboo Lines
,” ASME
Paper No. IPACK2007-33237.10.1115/IPACK2007-3323713.
Hasegawa
, K.
, Sasagawa
, K.
, Uno
, S.
, Saka
, M.
, and Abé
, H.
, 2009
, “Derivation of Film Characteristic Constants of Polycrystalline Line for Reliability Evaluation Against Electromigration Failure
,” Mech. Mater.
, 41
(10), pp. 1090
–1095
.10.1016/j.mechmat.2009.04.00914.
Maruyama
, H.
, Ishibashi
, T.
, Hirahara
, K.
, and Nakayama
, Y.
, 2010
, “Carbon Nanotube Sharpening Using an Induced Electrical Current
,” Appl. Phys. Express
, 3
(2), p. 025101
.10.1143/APEX.3.02510115.
Ajayan
, P. M.
, Ebbesen
, T. W.
, Ichihashi
, T.
, Iijima
, S.
, Tanigaki
, K.
, and Hiura
, H.
, 1993
, “Opening Carbon Nanotubes With Oxygen and Implications for Filling
,” Nature
, 362
(6420), pp. 522
–525
.10.1038/362522a0Copyright © 2014 by ASME
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