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Issues
September 1995
ISSN 1043-7398
EISSN 1528-9044
In this Issue
Technical Papers
Non-Fourier Heat Conduction in IC Chip
J. Electron. Packag. September 1995, 117(3): 174–177.
doi: https://doi.org/10.1115/1.2792088
Topics:
Diffusion (Physics)
,
Heat conduction
,
Noise (Sound)
,
Reliability
,
Temperature
,
Thermal stresses
,
Transient heat transfer
,
Waves
A Study on Wire Sweep in Encapsulation of Semiconductor Chips Using Simulated Experiments
J. Electron. Packag. September 1995, 117(3): 178–184.
doi: https://doi.org/10.1115/1.2792089
Topics:
Semiconductors (Materials)
,
Wire
,
Deformation
,
Flow (Dynamics)
,
Bubbles
,
Cavities
,
Fluids
,
Model development
,
Shapes
,
Transfer molding
Thermal Deformation Analysis of Various Electronic Packaging Products by Moire´ and Microscopic Moire´ Interferometry
J. Electron. Packag. September 1995, 117(3): 185–191.
doi: https://doi.org/10.1115/1.2792090
Finite Element Viscoelastic Analysis of Temperature and Moisture Effects in Electronic Packaging
J. Electron. Packag. September 1995, 117(3): 192–200.
doi: https://doi.org/10.1115/1.2792091
A Micro-Mechanics Investigation on the Bonding Strength of Heteroepitaxical Film or Strip on a Hard Substrate
J. Electron. Packag. September 1995, 117(3): 201–207.
doi: https://doi.org/10.1115/1.2792092
Investigation of a Heat Pipe Array for Convective Cooling
J. Electron. Packag. September 1995, 117(3): 208–214.
doi: https://doi.org/10.1115/1.2792093
Topics:
Cooling
,
Heat pipes
,
Heat
,
Copper
,
Electrical measurement
,
Fins
,
Flow (Dynamics)
,
Pressure drop
,
Thermal resistance
,
Water
Jet-Flow Scavenging of a Curing Oven—Part I: Flow Visualization
J. Electron. Packag. September 1995, 117(3): 215–219.
doi: https://doi.org/10.1115/1.2792094
Topics:
Flow visualization
,
Hardening (Curing)
,
Jets
,
Ovens
,
Vapors
,
Vortices
,
Condensation
,
Contamination
,
Flow (Dynamics)
,
Bonding
Jet-Flow Scavenging of a Curing Oven—Part II: Numerical Simulation
J. Electron. Packag. September 1995, 117(3): 220–224.
doi: https://doi.org/10.1115/1.2792095
Topics:
Computer simulation
,
Hardening (Curing)
,
Jets
,
Ovens
,
Pressure
,
Vapors
,
Design
,
Contamination
,
Flow visualization
,
Heat
Environmental Scanning Electron Microscopic Investigation of Failure Mechanisms in Electronic Packages
J. Electron. Packag. September 1995, 117(3): 225–229.
doi: https://doi.org/10.1115/1.2792096
Topics:
Electronic packages
,
Electrons
,
Failure mechanisms
,
Bonding
,
Failure
,
Fibers
,
Microcracks
,
Printed circuit boards
,
Resins
,
Scanning electron microscopy
Study of Print Release Process in Solder Paste Printing
J. Electron. Packag. September 1995, 117(3): 230–234.
doi: https://doi.org/10.1115/1.2792097
Application of Statistical Clustering to Screen Printing Process Control
J. Electron. Packag. September 1995, 117(3): 235–240.
doi: https://doi.org/10.1115/1.2792098
Topics:
Performance
,
Printing
,
Process control
,
Surface mount assemblies
Wetting Kinetics of Molten 60Sn40Pb on a Ag-0.33 wt.% Pt Thick Film Conductor
J. Electron. Packag. September 1995, 117(3): 241–245.
doi: https://doi.org/10.1115/1.2792099
Topics:
Thick films
,
Wetting
,
Temperature
,
Tin
,
Alloys
,
Atoms
,
Diffusion (Physics)
,
Intermetallic compounds
,
Solders
Technical Briefs
Numerical Studies of Non-Newtonian Channel Flow and Heat Transfer Enhancement for Electronics Modules
J. Electron. Packag. September 1995, 117(3): 246–249.
doi: https://doi.org/10.1115/1.2792100
Topics:
Channel flow
,
Electronics
,
Heat transfer
A Rubbery Cure Shrinkage Model for Analyzing Encapsulated Assemblies
J. Electron. Packag. September 1995, 117(3): 249–254.
doi: https://doi.org/10.1115/1.2792101
Topics:
Shrinkage (Materials)
,
Hardening (Curing)
,
Epoxy resins
,
Finite element analysis
,
Stress
,
Temperature
,
Constitutive equations
,
Cooling
,
Damage
,
Delamination
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Sequential Versus Concurrent Effects in Combined Stress Solder Joint Reliability
J. Electron. Packag
Anand Model Constants of Sn-Ag-Cu Solders: What Do They Actually Mean?
J. Electron. Packag