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Keywords: convolution neural network
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Journal Articles
Journal:
Journal of Electronic Packaging
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. March 2025, 147(1): 011006.
Paper No: EP-23-1004
Published Online: August 9, 2024
.... An automated solution using convolutional neural network (CNN) is proposed for void detection in chip images to replace the conventional manual inspection approach. The CNN model built on MobileNetV2 attains a mean average precision of 0.533. This method calculates void percentage, adhering to Institute...