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Keywords: failure
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Journal Articles
Journal:
Journal of Electronic Packaging
Publisher: ASME
Article Type: Research-Article
J. Electron. Packag. September 2020, 142(3): 031121.
Paper No: EP-20-1008
Published Online: August 7, 2020
.... Failure mechanisms have been studied for both cyclic-flexure and cyclic-twist using scanning electron microscopy (SEM) and optical imaging. Experimental data indicate that while the resistance increased with the cycles-to-failure, none of the replicates exceeded the 20% resistance-increase threshold...