Skip Nav Destination
Close Modal
Update search
Filter
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- ISBN-10
- ISSN
- EISSN
- Issue
- Journal Volume Number
- References
- Conference Volume Title
- Paper No
Filter
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- ISBN-10
- ISSN
- EISSN
- Issue
- Journal Volume Number
- References
- Conference Volume Title
- Paper No
Filter
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- ISBN-10
- ISSN
- EISSN
- Issue
- Journal Volume Number
- References
- Conference Volume Title
- Paper No
Filter
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- ISBN-10
- ISSN
- EISSN
- Issue
- Journal Volume Number
- References
- Conference Volume Title
- Paper No
Filter
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- ISBN-10
- ISSN
- EISSN
- Issue
- Journal Volume Number
- References
- Conference Volume Title
- Paper No
Filter
- Title
- Author
- Author Affiliations
- Full Text
- Abstract
- Keyword
- DOI
- ISBN
- ISBN-10
- ISSN
- EISSN
- Issue
- Journal Volume Number
- References
- Conference Volume Title
- Paper No
NARROW
Format
Article Type
Subject Area
Topics
Date
Availability
1-3 of 3
Keywords: doping profiles
Close
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Sort by
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Heat Mass Transfer. February 2010, 132(2): 023302.
Published Online: November 30, 2009
... conversion, nanoscale thermal imaging, and nanothermal manufacturing. 18 09 2008 16 03 2009 30 11 2009 30 11 2009 dielectric function doping profiles electronic density of states elemental semiconductors heat radiation radiative transfer semiconductor doping silicon...
Journal Articles
Publisher: ASME
Article Type: Research Papers
J. Heat Mass Transfer. February 2010, 132(2): 023301.
Published Online: November 30, 2009
... and reflectance (for incidence from either side) of all four samples Figure 7 shows the measured transmittance and reflectance compared with theoretical modeling results for Sample 1 to 4. The transmittance and reflectance is calculated from Eq. 6 using the doping profiles obtained from SIMS...
Journal Articles
Publisher: ASME
Article Type: Technical Papers
J. Heat Mass Transfer. January 2007, 129(1): 71–78.
Published Online: May 17, 2006
... incoherent light annealing rapid thermal annealing silicon elemental semiconductors doping profiles light reflection rough surfaces Gaussian distribution finite difference time-domain analysis reflectivity Electromagnetic (EM) wave scattering is an active, interdisciplinary area of research...