1-3 of 3
M. Dube
Close
Save search
Follow your search
Access your saved searches in your account
Would you like to receive an alert when new items match your search?
Close Modal
Sort by
Journal Articles

Closure to “Discussion of ‘Yield Function for Solder Elastoviscoplastic Modeling’” (2005, ASME J. Electron. Packag. , 127, pp. 147–156)

M. Dube, T. Kundu
Journal: Journal of Electronic Packaging
Publisher: ASME
Article Type: Discussions
J. Electron. Packag. December 2011, 133(4): 045502.
https://doi.org/10.1115/1.4000902
Published Online: November 17, 2011
View Article titled, Closure to “Discussion of ‘Yield Function for Solder Elastoviscoplastic Modeling’” (2005, ASME J. Electron. Packag. , 127, pp. 147–156)
Open the PDF for Closure to “Discussion of ‘Yield Function for Solder Elastoviscoplastic Modeling’” (2005, ASME J. Electron. Packag. , 127, pp. 147–156) in another window
Topics: Electrons, Solders, Hardening
Journal Articles

Yield Function for Solder Elastoviscoplastic Modeling

M. Dube, T. Kundu
Journal: Journal of Electronic Packaging
Publisher: ASME
Article Type: Research Papers
J. Electron. Packag. June 2005, 127(2): 147–156.
https://doi.org/10.1115/1.1869514
Published Online: September 14, 2004
View Article titled, Yield Function for Solder Elastoviscoplastic Modeling
Open the PDF for Yield Function for Solder Elastoviscoplastic Modeling in another window
Topics: Modeling, Solders, Temperature, Simulation, Stress
Journal Articles

Failure Analysis of Liquid Crystal Displays Due to Indium Tin Oxide Breakdown

T. J. Dishoungh, M. Dube, M. Pecht, J. Wyler
Journal: Journal of Electronic Packaging
Publisher: ASME
Article Type: Technical Briefs
J. Electron. Packag. June 1999, 121(2): 126–127.
https://doi.org/10.1115/1.2792667
Published Online: June 1, 1999
View Article titled, Failure Analysis of Liquid Crystal Displays Due to Indium Tin Oxide Breakdown
Open the PDF for Failure Analysis of Liquid Crystal Displays Due to Indium Tin Oxide Breakdown in another window
Topics: Failure analysis, Liquid crystals