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Thomas W. LeBrun
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Proceedings Papers

Evaluation of a Trapping Potential Measurement Technique for Optical Tweezers Using Simulations and Experiments

Arvind Balijepalli, Thomas W. LeBrun, Jason J. Gorman, Satyandra K. Gupta
Proc. ASME. IDETC-CIE2009, Volume 6: ASME Power Transmission and Gearing Conference; 3rd International Conference on Micro- and Nanosystems; 11th International Conference on Advanced Vehicle and Tire Technologies, 695-705, August 30–September 2, 2009
Publisher: American Society of Mechanical Engineers
Paper No: DETC2009-86687
https://doi.org/10.1115/DETC2009-86687
View Paper titled, Evaluation of a Trapping Potential Measurement Technique for Optical Tweezers Using Simulations and Experiments
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Topics: Engineering simulation, Simulation, Dimensions, Force measurement, Nanoparticles, Shapes, Diffusion (Physics), Displacement, Dynamics (Mechanics), Errors
Journal Articles

Stochastic Simulations With Graphics Hardware: Characterization of Accuracy and Performance

Arvind Balijepalli, Thomas W. LeBrun, Satyandra K. Gupta
Journal: Journal of Computing and Information Science in Engineering
Publisher: ASME
Article Type: Research Papers
J. Comput. Inf. Sci. Eng. March 2010, 10(1): 011010.
https://doi.org/10.1115/1.3270248
Published Online: March 10, 2010
View Article titled, Stochastic Simulations With Graphics Hardware: Characterization of Accuracy and Performance
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Topics: Graphics processing units, Particulate matter, Simulation, Errors, Hardware, Diffusion (Physics)
Journal Articles

Algorithms for Extraction of Nanowire Lengths and Positions From Optical Section Microscopy Image Sequence

Tao Peng, Arvind Balijepalli, Satyandra K. Gupta, Thomas W. LeBrun
Journal: Journal of Computing and Information Science in Engineering
Publisher: ASME
Article Type: Research Papers
J. Comput. Inf. Sci. Eng. December 2009, 9(4): 041007.
https://doi.org/10.1115/1.3249573
Published Online: November 24, 2009
View Article titled, Algorithms for Extraction of Nanowire Lengths and Positions From Optical Section Microscopy Image Sequence
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Topics: Algorithms, Nanowires, Wire
Proceedings Papers

Radial Basis Function Based Simplified Trapping Probability Models for Optical Tweezers

Ashis G. Banerjee, Arvind Balijepalli, Satyandra K. Gupta, Thomas W. LeBrun
Proc. ASME. IDETC-CIE2008, Volume 3: 28th Computers and Information in Engineering Conference, Parts A and B, 99-109, August 3–6, 2008
Publisher: American Society of Mechanical Engineers
Paper No: DETC2008-49124
https://doi.org/10.1115/DETC2008-49124
View Paper titled, Radial Basis Function Based Simplified Trapping Probability Models for Optical Tweezers
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Topics: Probability, Simulation, Laser beams, Particulate matter
Proceedings Papers

Algorithms for Extraction of Nanowires Attributes From Optical Section Microscopy Images

Tao Peng, Arvind Balijepalli, Satyandra K. Gupta, Thomas W. LeBrun
Proc. ASME. IDETC-CIE2007, Volume 2: 27th Computers and Information in Engineering Conference, Parts A and B, 279-290, September 4–7, 2007
Publisher: American Society of Mechanical Engineers
Paper No: DETC2007-35456
https://doi.org/10.1115/DETC2007-35456
View Paper titled, Algorithms for Extraction of Nanowires Attributes From Optical Section Microscopy Images
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Topics: Algorithms, Microscopy, Nanowires, Manufacturing, Blocks (Building materials), Brownian motion, Feature extraction, Nanoscale devices
Journal Articles

Generating Simplified Trapping Probability Models From Simulation of Optical Tweezers System

Ashis Gopal Banerjee, Arvind Balijepalli, Satyandra K. Gupta, Thomas W. LeBrun
Journal: Journal of Computing and Information Science in Engineering
Publisher: ASME
Article Type: Research Papers
J. Comput. Inf. Sci. Eng. June 2009, 9(2): 021003.
https://doi.org/10.1115/1.3130784
Published Online: May 20, 2009
View Article titled, Generating Simplified Trapping Probability Models From Simulation of Optical Tweezers System
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Topics: Probability, Simulation, Laser beams
Proceedings Papers

Algorithms for On-Line Monitoring of Components in an Optical Tweezers-Based Assembly Cell

Tao Peng, Arvind Balijepalli, Satyandra K. Gupta, Thomas W. LeBrun
Proc. ASME. IDETC-CIE2006, Volume 3: 26th Computers and Information in Engineering Conference, 297-309, September 10–13, 2006
Publisher: American Society of Mechanical Engineers
Paper No: DETC2006-99546
https://doi.org/10.1115/DETC2006-99546
View Paper titled, Algorithms for On-Line Monitoring of Components in an Optical Tweezers-Based Assembly Cell
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Topics: Algorithms, Manufacturing, Microscale devices, Microscopy, Nanoscale phenomena, Nanowires
Proceedings Papers

A Flexible System Framework for a Nanoassembly Cell Using Optical Tweezers

Arvind Balijepalli, Thomas W. LeBrun, Satyandra K. Gupta
Proc. ASME. IDETC-CIE2006, Volume 3: 26th Computers and Information in Engineering Conference, 333-342, September 10–13, 2006
Publisher: American Society of Mechanical Engineers
Paper No: DETC2006-99563
https://doi.org/10.1115/DETC2006-99563
View Paper titled, A Flexible System Framework for a Nanoassembly Cell Using Optical Tweezers
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Topics: Computer software, Flexible systems, Hardware, Instrumentation, Manufacturing, Nanomanufacturing, Simulation, Software architecture, User interfaces